TDDBTime dependent Dielectric BreakdownHTGBHigh Temperature Gate BiasHTRGHigh Temperature Reverse BiasBLTBias Life TestIntermittent Operation Life等测试方法htgbtddb区别,适用于不同产品类别htgbtddb区别的评估。
作者:shouye 浏览量:10 时间:2025-04-25 01:25:02
TDDBTime dependent Dielectric BreakdownHTGBHigh Temperature Gate BiasHTRGHigh Temperature Reverse BiasBLTBias Life TestIntermittent Operation Life等测试方法htgbtddb区别,适用于不同产品类别htgbtddb区别的评估。